TY  - BOOK
AU  - Shahriar, Selim, ed.
TI  - Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
T2  - Proceedings of SPIE; V. 10934
SN  - 9781510625105 (Print)
PY  - 2019///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/10934
ER  -