TY  - BOOK
AU  - Hatsuzawa, Takeshi, ed.
TI  - Optical Technology and Measurement for Industrial Applications Conference
T2  - Proceedings of SPIE; V. 11142
SN  - 9781510629776 (Print)
PY  - 2019///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/11142
ER  -