Hatsuzawa, Takeshi, ed. <br/><br/>
Optical Technology and Measurement for Industrial Applications Conference  [eBook] 

 - Washington, USA  SPIE  2019 
 - Online resource 
 - Proceedings of SPIE; V. 11142 .
<br/><br/><label>ISBN: </label>9781510629776 (Print) 9781510629783 (Online)