TY  - BOOK
AU  - Hatsuzawa, Takeshi, ed.
TI  - Optical Technology and Measurement for Industrial Applications 2020
T2  - Proceedings of SPIE; V. 11523
SN  - 9781510638532 (Print)
PY  - 2020///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/11523
ER  -