TY  - BOOK
AU  - Sasián, José, ed.
TI  - Optical System Alignment, Tolerancing, and Verification XII
T2  - Proceedings of SPIE; V. 10747
SN  - 9781510620650 (Print)
PY  - 2018///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/10747
ER  -