TY  - BOOK
AU  - Flagello, Donis, ed.
TI  - Optical Microlithography XX
T2  - Proceedings of SPIE; V. 6520
SN  - 9780819466396 (Print)
PY  - 2007///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/6520
ER  -