00520nam a2200145Ia 4500003000900000008004100009020002600050040001600076100002400092245007000116260003200186300002000218490003300238856010300271IN-BaIIA211028s9999 xx s 000 0 eng d a9781628416855 (Print) cIIA Library aLehmann, Peter, ed. 0aOptical Measurement Systems for Industrial Inspection IXh[eBook] aWashington, USAbSPIEc2015 aOnline resource aProceedings of SPIE; V. 9525 uhttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/9525yClick Here to Access eBook