TY  - BOOK
AU  - Greenwell, Roger, ed.
TI  - Optical Materials Reliability and Testing: Benign and Adverse Environments
T2  - Proceedings of SPIE; V. 1791
SN  - 9780819409706 (Print)
PY  - 1993///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/1791
ER  -