TY  - BOOK
AU  - Huang, Peisen, ed.
TI  - Optical Inspection and Metrology for Non-Optics Industries
T2  - Proceedings of SPIE; V. 7432
SN  - 9780819477224 (Print)
PY  - 2009///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/7432
ER  -