TY  - BOOK
AU  - Duparré, Angela, ed.
TI  - Optical Fabrication, Testing, and Metrology II
T2  - Proceedings of SPIE; V. 5965
SN  - 9780819459831 (Print)
PY  - 2005///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/5965
ER  -