TY  - BOOK
AU  - Balandin, Alexander, ed.
TI  - Noise in Devices and Circuits III
T2  - Proceedings of SPIE; V. 5844
SN  - 9780819458391 (Print)
PY  - 2005///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/5844
ER  -