TY  - BOOK
AU  - Deen, M. Jamal, ed.
TI  - Noise in Devices and Circuits
T2  - Proceedings of SPIE; V. 5113
SN  - 9780819449733 (Print)
PY  - 2003///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/5113
ER  -