TY  - BOOK
AU  - Smulko, Janusz, ed.
TI  - Noise and Information in Nanoelectronics, Sensors, and Standards II
T2  - Proceedings of SPIE; V. 5472
SN  - 9780819453945 (Print)
PY  - 2004///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/5472
ER  -