TY  - BOOK
AU  - Kish, Laszlo, ed.
TI  - Noise and Information in Nanoelectronics, Sensors, and Standards
T2  - Proceedings of SPIE; V. 5115
SN  - 9780819449757 (Print)
PY  - 2003///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/5115
ER  -