TY  - BOOK
AU  - Macucci, Massimo, ed.
TI  - Noise and Fluctuations in Circuits, Devices, and Materials
T2  - Proceedings of SPIE; V. 6600
SN  - 9780819467379 (Print)
PY  - 2007///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/6600
ER  -