TY  - BOOK
AU  - Quan, Chenggen, ed.
TI  - Ninth International Symposium on Laser Metrology
T2  - Proceedings of SPIE; V. 7155
SN  - 9780819473981 (Print)
PY  - 2008///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/7155
ER  -