TY  - BOOK
AU  - Zhu, Xing, ed.
TI  - Nanophotonics, Nanostructure, and Nanometrology
T2  - Proceedings of SPIE; V. 5635
SN  - 9780819455901 (Print)
PY  - 2005///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/5635
ER  -