Glembocki, Orest, ed. <br/><br/>
Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices  [eBook] 

 - Washington, USA  SPIE  1987 
 - Online resource 
 - Proceedings of SPIE; V. 0794 .
<br/><br/><label>ISBN: </label>9780892528295 (Print)