TY  - BOOK
AU  - Prasad, Sharad, ed.
TI  - Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV
T2  - Proceedings of SPIE; V. 3510
SN  - 9780819429698 (Print)
PY  - 1998///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/3510
ER  -