Prasad, Sharad, ed. <br/><br/>
Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV  [eBook] 

 - Washington, USA  SPIE  1998 
 - Online resource 
 - Proceedings of SPIE; V. 3510 .
<br/><br/><label>ISBN: </label>9780819429698 (Print)