@book{28240,
	author = {Prasad, Sharad, ed.},
	title = {Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV},
	publisher = {SPIE},
	year = {1998},
	series = {Proceedings of SPIE; V. 3510},
	address = {Washington, USA},
	url = {https://www.spiedigitallibrary.org/conference-proceedings-of-spie/3510}
}