TY  - BOOK
AU  - Keshavarzi, Ali, ed.
TI  - Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II
T2  - Proceedings of SPIE; V. 2874
SN  - 9780819422729 (Print)
PY  - 1996///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/2874
ER  -