00538nam a2200145Ia 4500003000900000008004100009020002600050040001600076100002500092245008700117260003200204300002000236490003300256856010300289IN-BaIIA211028s9999    xx      s     000 0 eng d  a9780819422729 (Print)  cIIA Library  aKeshavarzi, Ali, ed. 0aMicroelectronic Manufacturing Yield, Reliability, and Failure Analysis IIh[eBook]  aWashington, USAbSPIEc1996  aOnline resource  aProceedings of SPIE; V. 2874  uhttps://www.spiedigitallibrary.org/conference-proceedings-of-spie/2874yClick Here to Access eBook