Keshavarzi, Ali, ed. <br/><br/>
Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II  [eBook] 

 - Washington, USA  SPIE  1996 
 - Online resource 
 - Proceedings of SPIE; V. 2874 .
<br/><br/><label>ISBN: </label>9780819422729 (Print)