@book{28238,
	author = {Keshavarzi, Ali, ed.},
	title = {Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II},
	publisher = {SPIE},
	year = {1996},
	series = {Proceedings of SPIE; V. 2874},
	address = {Washington, USA},
	url = {https://www.spiedigitallibrary.org/conference-proceedings-of-spie/2874}
}