TY  - BOOK
AU  - Batchelor, Bruce, ed.
TI  - Machine Vision Systems for Inspection and Metrology VII
T2  - Proceedings of SPIE; V. 3521
SN  - 9780819429827 (Print)
PY  - 1998///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/3521
ER  -