TY  - BOOK
AU  - Wang, Shing-Chung, ed.
TI  - Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V
T2  - Proceedings of SPIE; V. 3945
SN  - 9780819435620 (Print)
PY  - 2000///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/3945
ER  -