TY  - BOOK
AU  - Yoshizawa, Toru, ed.
TI  - International Symposium on Polarization Analysis and Applications to Device Technology
T2  - Proceedings of SPIE; V. 2873
SN  - 9780819422712 (Print)
PY  - 1996///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/2873
ER  -