TY  - BOOK
AU  - Svechnikov, Sergey, ed.
TI  - International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
T2  - Proceedings of SPIE; V. 2648
SN  - 9780819420213 (Print)
PY  - 1995///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/2648
ER  -