TY  - BOOK
AU  - Valiev, Kamil, ed.
TI  - International Conference on Micro- and Nano-Electronics 2009
T2  - Proceedings of SPIE; V. 7521
SN  - 9780819479112 (Print)
PY  - 2010///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/7521
ER  -