TY  - BOOK
AU  - Wu, Shaofei, ed.
TI  - International Conference on Image Processing and Pattern Recognition in Industrial Engineering
T2  - Proceedings of SPIE; V. 7820
SN  - 9780819483294 (Print)
PY  - 2010///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/7820
ER  -