TY  - BOOK
AU  - Creath, Kathy, ed.
TI  - Interferometry: Surface Characterization and Testing
T2  - Proceedings of SPIE; V. 1776
SN  - 9780819409492 (Print)
PY  - 1992///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/1776
ER  -