Postek, Michael, ed. <br/><br/>
Instrumentation, Metrology, and Standards for Nanomanufacturing II  [eBook] 

 - Washington, USA  SPIE  2008 
 - Online resource 
 - Proceedings of SPIE; V. 7042 .
<br/><br/><label>ISBN: </label>9780819472625 (Print)