TY  - BOOK
AU  - Postek, Michael, ed.
TI  - Instrumentation, Metrology, and Standards for Nanomanufacturing
T2  - Proceedings of SPIE; V. 6648
SN  - 9780819467966 (Print)
PY  - 2007///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/6648
ER  -