Kissinger, Gudrun, ed. <br/><br/>
In-Line Characterization, Yield, Reliability, and Failure Analysis in Microelectronic Manufacturing II  [eBook] 

 - Washington, USA  SPIE  2001 
 - Online resource 
 - Proceedings of SPIE; V. 4406 .
<br/><br/><label>ISBN: </label>9780819441072 (Print)