TY  - BOOK
AU  - Jüptner, Werner, ed.
TI  - Industrial Applications of Holographic and Speckle Measuring Techniques
T2  - Proceedings of SPIE; V. 1508
SN  - 9780819406170 (Print)
PY  - 1991///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/1508
ER  -