TY  - BOOK
AU  - Tan, Jiubin, ed.
TI  - Fifth International Symposium on Instrumentation Science and Technology
T2  - Proceedings of SPIE; V. 7133
SN  - 9780819473677 (Print)
PY  - 2009///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/7133
ER  -