TY  - BOOK
AU  - Fallahi, Mahmoud, ed.
TI  - Fabrication, Testing, Reliability, and Applications of Semiconductor Lasers III
T2  - Proceedings of SPIE; V. 3285
SN  - 9780819427243 (Print)
PY  - 1998///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/3285
ER  -