TY  - BOOK
AU  - Fallahi, Mahmoud, ed.
TI  - Fabrication, Testing, and Reliability of Semiconductor Lasers II
T2  - Proceedings of SPIE; V. 3004
SN  - 9780819424150 (Print)
PY  - 1997///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/3004
ER  -