TY  - BOOK
AU  - Fallahi, Mahmoud, ed.
TI  - Fabrication, Testing, and Reliability of Semiconductor Lasers
T2  - Proceedings of SPIE; V. 2683
SN  - 9780819420572 (Print)
PY  - 1996///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/2683
ER  -