TY  - BOOK
AU  - Resnick, Douglas, ed.
TI  - Electron-Beam, X-Ray, and Ion-Beam Technology: Submicrometer Lithographies IX
T2  - Proceedings of SPIE; V. 1263
SN  - 9780819403100 (Print)
PY  - 1990///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/1263
ER  -