TY  - BOOK
AU  - Tobin, Kenneth, ed.
TI  - Data Analysis and Modeling for Process Control
T2  - Proceedings of SPIE; V. 5378
SN  - 9780819452917 (Print)
PY  - 2004///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/5378
ER  -