TY  - BOOK
AU  - Beyerer, Jürgen, ed.
TI  - Automated Visual Inspection and Machine Vision III
T2  - Proceedings of SPIE; V. 11061
SN  - 9781510628014 (Print)
PY  - 2019///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/11061
ER  -