Beyerer, Jürgen, ed. <br/><br/>
Automated Visual Inspection and Machine Vision III  [eBook] 

 - Washington, USA  SPIE  2019 
 - Online resource 
 - Proceedings of SPIE; V. 11061 .
<br/><br/><label>ISBN: </label>9781510628014 (Print) 9781510628021 (Online)