TY  - BOOK
AU  - Beyerer, Jürgen, ed.
TI  - Automated Visual Inspection and Machine Vision II
T2  - Proceedings of SPIE; V. 10334
SN  - 9781510611139 (Print)
PY  - 2017///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/10334
ER  -