Beyerer, Jürgen, ed. <br/><br/>
Automated Visual Inspection and Machine Vision II  [eBook] 

 - Washington, USA  SPIE  2017 
 - Online resource 
 - Proceedings of SPIE; V. 10334 .
<br/><br/><label>ISBN: </label>9781510611139 (Print) 9781510611146 (Online)