TY  - BOOK
AU  - Ye, Shenghua, ed.
TI  - Automated Optical Inspection for Industry: Theory, Technology, and Applications II
T2  - Proceedings of SPIE; V. 3558
SN  - 9780819430199 (Print)
PY  - 1998///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/3558
ER  -