TY  - BOOK
AU  - Piché, Michel, ed.
TI  - Advances in Optical Beam Characterization and Measurements
T2  - Proceedings of SPIE; V. 3418
SN  - 9780819428721 (Print)
PY  - 1998///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/3418
ER  -