TY  - BOOK
AU  - Assoufid, Lahsen, ed.
TI  - Advances in Metrology for X-Ray and EUV Optics VIII
T2  - Proceedings of SPIE; V. 11109
SN  - 9781510629110 (Print)
PY  - 2019///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/11109
ER  -