TY  - BOOK
AU  - Assoufid, Lahsen, ed.
TI  - Advances in Metrology for X-Ray and EUV Optics IX
T2  - Proceedings of SPIE; V. 11492
SN  - 9781510637900 (Print)
PY  - 2020///
CY  - Washington, USA
PB  - SPIE
UR  - https://www.spiedigitallibrary.org/conference-proceedings-of-spie/11492
ER  -